SEM Tin On Carbon Medium Resolution Test Specimen, JEOL Stub, Each

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Tin on Carbon is an alternate test specimen for medium resolution, and for the daily basic checking of your instrument performance. This specimen consists of a dispersion of tin spheres, within the size range 10 - 40 nm, on a carbon substrate. Ideal for astigmatism correction, it is also recommended for use in SEM's employed in the semi-conductor industry where the usual gold on carbon specimen cannot be used because of the risk of gold poisoning.