MXS Calibration Standard 301BE for AFM, SEM Mounted, 300 nm Spacing, Each

Details

EMS offers a series of calibration standards with one and two dimension calibrated patterns. These standards are created utilizing holographic interference of a particular laser frequency. They are typically accurate to <1% across the entire surface of the standard. These reference standards are remarkably durable under typical operating conditions. The surface contamination behavior is also very good. There are no better sub-micron reference standard available in this price range. 300 nanometers grid spacing of parallel ridges of Ti lines on silica. For AFM, SEM, TOF-SIMS, Auger