$ 3,857.03
Details
A useful tool for checking Scanning Electron Microscopes with Energy Dispersive or Wavelength Dispersive X-ray systems. Standards include cobalt which is compulsory for checking Energy Dispersive analyzers and any other five with the exception of the SRM 481, SRM 482 and SRM 1872. Duplex Brass is used for checking the contrast efficiency of Back Scattered detectors and is capable of detecting two major copper/zinc phases of 0.1 atomic number difference. A Faraday Cage for measuring the beam current at the specimen plane is in the center. S168T gold crystals on a carbon background is useful for checking the performance of the SEM at high-resolution with a finer than a 10 micron probe. S1930 silicon test specimen with squares of periodicity 9.9 micrometers lines about 1.9 micrometers is used for magnification calibration and assessing image distribution. Consists of 6 standards, duplex brass, Faraday cage, SD168T, S1930, S168U, 1000 mesh and 2000 mesh grid on 32mm diameter block
